Engineering Abbreviations
"A"
"B",
"C",
"D",
"E",
"F",
"G",
"H",
"I",
"J",
"K",
"L",
"M",
"N",
"O",
"P",
"Q",
"R",
"S",
"T",
"U",
"V",
"W",
"X",
"Y",
"Z"
Unit Test Acronyms
ALT | - | Accelerated Life Testing |
AST | - | Accelerated Stress Testing |
ATE | - | Automatic Test Equipment |
AUT | - | Antenna Under Test |
BIST | - | Backward Instability Shock Test |
CCA | - | Circuit Card Assembly |
CFM | - | Cubic Feet per Minute |
DPA | - | Destructive Physical Analysis |
DUT | - | Device Under Test [DUT Terms] |
ED | - | Electro-dynamic [ElectroDynamic] |
ESD | - | ElectroStatic Discharge [ESD Terms] |
ESDS | - | Electrostatic Discharge Sensitivity |
ESS | - | Environmental Stress Screening [Burn-in] |
FIST | - | Forward Instability Shock Test |
FWHM | - | Full-Width Half-Max |
GUT | - | Gate Under Test |
HALT | - | Highly Accelerated Stress Test |
HASS | - | Highly Accelerated Stress Screening |
HTRB | - | High Temperature Reverse Bias |
LINAC | - | Linear Accelerator |
NIST | - | National Institute of Standards and Technology |
PIND | - | Particle Impact Noise Detection |
PoF | - | Physics of Failure, Point of Failure |
RET | - | Reliability Enhanced Testing |
RH | - | Relative Humidity |
SIR | - | Surface Insulation Resistance |
SOA | - | Safe Operating Area [SOA Definition] |
SSOP | - | Steady-State Operating Power |
STU | - | Sensitivity Test Unit |
TLD | - | Thermoluminescence Dosimetry |
TSP | - | Temperature Sensitive Parameter |
TUT | - | Transistor Under Test |
UUT | - | Unit Under Test |
DUT Transistor Circuit, Device Under Test
Test Equipment Manufacturers, Thermal Chambers Manufacturers
Use Environment per MIL HDBK-217F Definitions
Mean Time Between Failures (MTBF) Definitions
MIL-STD-2218 - Thermal Design, Analysis and Test Criteria for Airborne Electronic Equipment
MIL-HDBK-251 - Reliability / design Thermal Applications
MIL-STD-901D Shock Tests H.I {High Impact} Shipboard Machinery, Equipment, and System Requirements for