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Device Under Test
Device Under Test. [DUT] The component, device or system under going testing. Normally the Device Under Test is a component that forms a larger unit or module, while Unit Under Test [UUT] is the unit or system under test.
Note that System Under Test [SUT] is also in common usage as an acronym. The transistor is the Device Under Test [DUT], or Unit Under Test [UUT]. Additional System Test Acronyms.
Pulse Response Test Circuit
The graphic above shows a 2N1711 test circuit setup to test the Pulse Response of the transistor. Also refer to How to Derate a 2N1711.
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Saturated Switching Test Circuit
The graphic above shows a NPN transistor test circuit setup to test the Saturated Switching Turn-off Time of the transistor. Also refer to How to Derate an NPN Transistor.
In specific cases the term transistor Under Test or TUT may be seen used on military specifications. Example schematic using the term TUT; Transistor Circuits
